The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
Du, Yuanmin, Kumar, Amit, Pan, Hui, Zeng, Kaiyang, Wang, Shijie, Yang, Ping, Wee, Andrew Thye ShenVolume:
3
Année:
2013
Langue:
english
Journal:
AIP Advances
DOI:
10.1063/1.4818119
Fichier:
PDF, 1.32 MB
english, 2013