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[IEEE IECON 2010 - 36th Annual Conference of IEEE Industrial Electronics - Glendale, AZ (2010.11.7-2010.11.10)] IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society - Modeling the supervision of manufacturing system considering diagnosis and treatment of fault
Melo, José I Garcia, Morales, Roy A Gomez, Junqueira, Fabrício, dos Santos Filho, Diolino J, Miyagi, P.E.Année:
2010
Langue:
english
DOI:
10.1109/IECON.2010.5675043
Fichier:
PDF, 535 KB
english, 2010