SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Optical System Contamination: Effects, Measurements, and Control 2008 - Stray light analysis of SALEX instrument
Ham, Sun Jeong, Lee, Hanshin, Lee, Jae-Min, Kim, Sug-Whan, Richards, Tony, Lockwood, Mike, Straka, Sharon A.Volume:
7069
Année:
2008
Langue:
english
DOI:
10.1117/12.794505
Fichier:
PDF, 549 KB
english, 2008