[IEEE 2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA (2006.06.11-2006.06.16)] 2006 IEEE MTT-S International Microwave Symposium Digest - Identification of RF Power Amplifier Memory Effect Origins using Third-Order Intermodulation Distortion Amplitude and Phase Asymmetry
Kenney, J., Fedorenko, PavloAnnée:
2006
Langue:
english
DOI:
10.1109/MWSYM.2006.249387
Fichier:
PDF, 4.51 MB
english, 2006