SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV - Compensation for instrument anomalies in imaging infrared measurements
Dobbins, Christopher L., Holst, Gerald C., Krapels, Keith A., Dawson, James A., Lightfoot, Jay A., Edwards, William D., Cobb, Ryan S., Heckwolf, Amanda R.Volume:
8706
Année:
2013
Langue:
english
DOI:
10.1117/12.2015473
Fichier:
PDF, 770 KB
english, 2013