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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - High-resolution shape measurements with phase-shifting Schlieren (PSS)
Joannes, Luc C., Beghuin, Didier, Ligot, Renaud, Farinotti, Sebastien, Dupont, Olivier, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Année:
2004
Langue:
english
DOI:
10.1117/12.545536
Fichier:
PDF, 397 KB
english, 2004