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Scanning Probe Microscopy of Soft Matter (Fundamentals and Practices) || Nanolithography with Intrusive AFM Tip
Tsukruk, Vladimir V., Singamaneni, SrikanthVolume:
10.1002/97
Année:
2011
Langue:
english
DOI:
10.1002/9783527639953.ch18
Fichier:
PDF, 499 KB
english, 2011