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An interface crack in a functionally graded piezoelectric bi-layer under anti-plane shear impact
Jeong Woo Shin, Young-Shin Lee, Sung Joon KimVolume:
224
Langue:
english
DOI:
10.1007/s00707-012-0794-x
Date:
April, 2013
Fichier:
PDF, 676 KB
english, 2013