Electrically active defects in detector-grade CdTe:Cl and CdZnTe materials grown by THM and HPBM
L. Chibani, M. Hage-Ali, P. SiffertVolume:
161
Année:
1996
Langue:
english
Pages:
6
DOI:
10.1016/0022-0248(95)00626-5
Fichier:
PDF, 355 KB
english, 1996