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Post-range implantation damage in II–VI compounds due to electronically stimulated diffusion
H. Kerkow, V.X. Quang, B. SelleVolume:
117
Année:
1992
Langue:
english
Pages:
5
DOI:
10.1016/0022-0248(92)90835-7
Fichier:
PDF, 385 KB
english, 1992