SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Resolution improvement of the electronic theodolite in automatic guided laser theodolite system by subdivided locating method of image
Zhou, Hu, Zhu, Jigui, Zhang, Zili, Ye, Shenghua, Ye, Shenghua, Zhang, Guangjun, Ni, JunVolume:
7160
Année:
2009
Langue:
english
DOI:
10.1117/12.807057
Fichier:
PDF, 317 KB
english, 2009
File converter
Plus de résultats de recherche
More benefits 
