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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Transient analysis of crosstalk coupling between high-speed carbon nanotube interconnects
D'Amore, M., Sarto, M.S., Tamburrano, A.Année:
2008
Langue:
english
DOI:
10.1109/ISEMC.2008.4652016
Fichier:
PDF, 329 KB
english, 2008