SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Optical characterization for off-axis illumination in DLP system
Zhuang, Zhenfeng, Chen, Enguo, Qu, Bixiang, Yu, Feihong, Jiang, Yadong, Yu, Junsheng, Wang, ZhifengVolume:
8419
Année:
2012
Langue:
english
DOI:
10.1117/12.971183
Fichier:
PDF, 455 KB
english, 2012
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