Low-temperature exciton trapping on interface defects in semiconductor quantum wells
Bastard, G., Delalande, C., Meynadier, M. H., Frijlink, P. M., Voos, M.Volume:
29
Langue:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.29.7042
Date:
June, 1984
Fichier:
PDF, 190 KB
english, 1984