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Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
Béché, A., Rouvière, J.L., Barnes, J.P., Cooper, D.Volume:
131
Langue:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2013.03.014
Date:
August, 2013
Fichier:
PDF, 4.67 MB
english, 2013