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Microstructure evolution of sputtered BiSb–Te thermoelectric films during post-annealing and its effects on the thermoelectric properties
Jeon, Seong-jae, Jeon, Haseok, Na, Sekwon, Kang, Stephen D., Lyeo, Ho-Ki, Hyun, Seungmin, Lee, Hoo-JeongVolume:
553
Langue:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2012.11.040
Date:
March, 2013
Fichier:
PDF, 1.53 MB
english, 2013