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A New Reliability Calculation Algorithm Based on Sensitivity Analysis and its Application to Reliability-Based Robust Global Optimization of Electromagnetic Device with Uncertain Design Variables
Ren, Zi Yan, Zhang, Dian Hai, Pham, Minh Trien, Koh, Chang SeopVolume:
721
Langue:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.721.165
Date:
June, 2012
Fichier:
PDF, 515 KB
english, 2012