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High-Resolution Spectroscopy with Reciprocal-Space Analysis: Application to Isotopically Pure Si
S.D. Yoo, D.E. Aspnes, L.F. Lastras-Martínez, T. Ruf, M. Konuma, M. CardonaVolume:
220
Année:
2000
Langue:
english
Pages:
9
DOI:
10.1002/1521-3951(200007)220:13.0.co;2-4
Fichier:
PDF, 144 KB
english, 2000