Implications of the Contact Radius to Line Step (CRLS) Ratio in AFM for Nanotribology Measurements
Helt, James M., Batteas, James D.Volume:
22
Langue:
english
Journal:
Langmuir
DOI:
10.1021/la053288k
Date:
July, 2006
Fichier:
PDF, 1.57 MB
english, 2006