Uncertainty quantification in nanomechanical measurements using the atomic force microscope
Wagner, Ryan, Moon, Robert, Pratt, Jon, Shaw, Gordon, Raman, ArvindVolume:
22
Langue:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/45/455703
Date:
November, 2011
Fichier:
PDF, 1.53 MB
english, 2011