SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California (Saturday 22 January 2011)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X - Effects of radiation on MEMS
Shea, Herbert R., Garcia-Blanco, Sonia, Ramesham, RajeshuniVolume:
7928
Année:
2011
Langue:
english
DOI:
10.1117/12.876968
Fichier:
PDF, 408 KB
english, 2011