SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Ultra-precision surface polishing using ion beam figuring
Ghim, Young-Sik, You, Shin-Jae, Rhee, Hyug-Gyo, Yang, Ho-Soon, Lee, Yun-Woo, Yang, Li, Ruch, Eric, Li, ShengyiVolume:
8416
Année:
2012
Langue:
english
DOI:
10.1117/12.973725
Fichier:
PDF, 487 KB
english, 2012