SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Window and Dome Technologies and Materials XII - Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software
Murray, Ian B., Densmore, Victor, Bora, Vaibhav, Pieratt, Matthew W., Hibbard, Douglas L., Milster, Tom D., Tustison, Randal W.Volume:
8016
Année:
2011
Langue:
english
DOI:
10.1117/12.883422
Fichier:
PDF, 1.44 MB
english, 2011
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