SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light
Nakazawa, Taiki, Kuroda, Rihito, Koda, Yasumasa, Sugawa, Shigetoshi, Widenhorn, Ralf, Nguyen, Valérie, Dupret, AntoineVolume:
8298
Année:
2012
Langue:
english
DOI:
10.1117/12.907727
Fichier:
PDF, 620 KB
english, 2012