Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy
Lee, Hyo-Jong, Ha, Jun-Seok, Lee, S. W., Lee, H. J., Goto, H., Lee, S. H., Cho, M. W., Yao, T., Minegishi, T., Hanada, T., Hong, Soon-Ku, Sakata, Osami, Lee, Jae Wook, Lee, Jeong YongVolume:
91
Année:
2007
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2815919
Fichier:
PDF, 661 KB
english, 2007