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Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials
Álvarez-Murga, M., Bleuet, P., Hodeau, J.-L.Volume:
45
Langue:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s0021889812041039
Date:
December, 2012
Fichier:
PDF, 2.11 MB
english, 2012