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Backside optical measurements of picosecond internal gate delays in a flip-chip packaged silicon VLSI circuit
Heinrich, H.K., Pakdaman, N., Kent, D.S., Cropp, L.M.Volume:
3
Année:
1991
Langue:
english
DOI:
10.1109/68.87950
Fichier:
PDF, 277 KB
english, 1991