Internal stress evolution during field-induced crystallization of anodic tantalum oxide
Lei Yang, Mark Viste, Joachim Hossick-Schott, Brian W. SheldonVolume:
81
Année:
2012
Langue:
english
DOI:
10.1016/j.electacta.2012.07.035
Fichier:
PDF, 1.01 MB
english, 2012