Analysis of a method of measuring theS-parameters of microwave transistors
Yu. V. Ryasnyi, M. S. Chashkov, A. V. BorisovVolume:
55
Langue:
english
DOI:
10.1007/s11018-012-0109-6
Date:
January, 2013
Fichier:
PDF, 136 KB
english, 2013