
AIP Conference Proceedings [AIP 2010 WIDE BANDGAP CUBIC SEMICONDUCTORS: FROM GROWTH TO DEVICES: Proceedings of the E-MRS Symposium∗ F∗ - Strasbourg, (France) (8–10 October 2010)] - Internal Stress in Freestanding 3C-SiC Grown on Si and Relation to Carrier Lifetime
Grivickas, V., Gulbinas, K., Manolis, G., Kato, M., Linnros, J., Ferro, Gabriel, Siffert, PaulAnnée:
2010
Langue:
english
DOI:
10.1063/1.3518320
Fichier:
PDF, 716 KB
english, 2010