[IEEE 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Virginia Beach, VA, USA (2009.10.18-2009.10.21)] 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Leakage current analysis for predicting flashover in distribution network
Hong, Thinh Pham, Trong, Doan Ngo, Hoang, Dao VuAnnée:
2009
Langue:
english
DOI:
10.1109/ceidp.2009.5377704
Fichier:
PDF, 348 KB
english, 2009