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Analysis of surface roughness in Ti/Al/Ni/Au Ohmic contact to AlGaN/GaN high electron mobility transistors
Gong, Rumin, Wang, Jinyan, Liu, Shenghou, Dong, Zhihua, Yu, Min, Wen, Cheng P., Cai, Yong, Zhang, BaoshunVolume:
97
Année:
2010
Langue:
english
DOI:
10.1063/1.3479928
Fichier:
PDF, 1.44 MB
english, 2010