[IEEE 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE 2011) - Merida City, Mexico (2011.10.26-2011.10.28)] 2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control - Study of the properties of n+-type ZnO:Al films obtained from ZnO/Al/ZnO nanometric structure
Vasquez-A., M. A., Andraca-Adame, J. A., Romero-Paredes, G., Pena-Sierra, R.Année:
2011
Langue:
english
DOI:
10.1109/iceee.2011.6106641
Fichier:
PDF, 321 KB
english, 2011