Measuring the dielectric properties of materials. Ninety-year development from low-frequency techniques to broadband spectroscopy and high-frequency imaging
Kaatze, UVolume:
24
Langue:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/24/1/012005
Date:
January, 2013
Fichier:
PDF, 3.16 MB
english, 2013