New Fault-Based Side-Channel Attack Using Fault Sensitivity
Li, Yang, Ohta, Kazuo, Sakiyama, KazuoVolume:
7
Langue:
english
Journal:
IEEE Transactions on Information Forensics and Security
DOI:
10.1109/tifs.2011.2169666
Date:
February, 2012
Fichier:
PDF, 1.64 MB
english, 2012