[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems
Starr, George J., Qin, Jie, Dutton, Bradley F., Stroud, Charles E., Dai, F. Foster, Nelson, Victor P.Année:
2009
Langue:
english
DOI:
10.1109/dft.2009.43
Fichier:
PDF, 1.34 MB
english, 2009
File converter
Plus de résultats de recherche
More benefits 
