Improved Characterization Methodology of Gate-Bulk Leakage and Capacitance for Ultrathin Oxide Partially Depleted SOI Floating-Body CMOS
Chen, D.C., Lee, R., Yuan-Chang Liu, Guan-Shyan Lin, Mao-Chyuan Tang, Meng-Fan Wang, Chune-Sin Yeh, Shan-Chieh ChienVolume:
25
Année:
2012
Langue:
english
DOI:
10.1109/tsm.2011.2181668
Fichier:
PDF, 8.24 MB
english, 2012