Evidence of charge storage in a-Si:H p-i-n diode and lifetime of carriers
Jianyong Liu, Baojie Yan, Lifeng Shi, Xinhua Geng, Zhonglin Sun, Wenyuan XuVolume:
139
Année:
1992
Langue:
english
DOI:
10.1016/s0022-3093(05)80807-5
Fichier:
PDF, 237 KB
english, 1992