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A simple quality factor for characterization of thin silicon films
J. Kočka, T. Mates, M. Ledinský, H. Stuchlíková, J. Stuchlík, A. FejfarVolume:
354
Année:
2008
Langue:
english
DOI:
10.1016/j.jnoncrysol.2007.09.078
Fichier:
PDF, 465 KB
english, 2008