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Modeling of pan coating processes: Prediction of tablet content uniformity and determination of critical process parameters
Wei Chen, Shih-Ying Chang, San Kiang, Alexander Marchut, Olav Lyngberg, Jennifer Wang, Venkatramana Rao, Divyakant Desai, Howard Stamato, William EarlyVolume:
99
Année:
2010
Langue:
english
Pages:
13
DOI:
10.1002/jps.22044
Fichier:
PDF, 852 KB
english, 2010