Annealing induced defects in SiC, SiOx single layers, and SiC/SiOx hetero-superlattices
Kaining Ding, Urs Aeberhard, Wolfhard Beyer, Oleksandr Astakhov, Florian Köhler, Uwe Breuer, Friedhelm Finger, Reinhard Carius, Uwe RauVolume:
aop
Année:
2012
Langue:
english
Pages:
1
DOI:
10.1002/pssa.201200191
Fichier:
PDF, 531 KB
english, 2012