
[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - Improved SPICE macromodel of phase change random access memory
Huan-Lin Chang,, Hung-Chih Chang,, Shang-Chi Yang,, Hsi-Chun Tsai,, Hsuan-Chih Li,, Liu, C. W.Année:
2009
Langue:
english
Pages:
4
DOI:
10.1109/vdat.2009.5158113
Fichier:
PDF, 535 KB
english, 2009