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[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer
Bagheri, Mehdi, Naderi, Mohammad Salay, Blackburn, Trevor, Phung, ToanAnnée:
2012
Langue:
english
Pages:
5
DOI:
10.1109/elinsl.2012.6251477
Fichier:
PDF, 618 KB
english, 2012