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Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb_2S_3
Schubert, Mathias, Dollase, WayneVolume:
27
Année:
2002
Langue:
english
Journal:
ol/27/23/ol-27-23-2073.pdf
DOI:
10.1364/OL.27.002073
Fichier:
PDF, 113 KB
english, 2002