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Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing
Marcano O., A., Maillotte, H., Gindre, D., Métin, D.Volume:
21
Année:
1996
Langue:
english
Journal:
ol/21/2/ol-21-2-101.pdf
DOI:
10.1364/OL.21.000101
Fichier:
PDF, 487 KB
english, 1996