
In situ monitoring technique for fabrication of high-quality diffraction gratings
Nakano, Yoshiaki, Tada, KunioVolume:
13
Année:
1988
Langue:
english
Journal:
ol/13/1/ol-13-1-7.pdf
DOI:
10.1364/OL.13.000007
Fichier:
PDF, 339 KB
english, 1988