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Infrared ellipsometry study of the thickness-dependent vibration frequency shifts in silicon dioxide films
Ossikovski, Razvigor, Drévillon, Bernard, Firon, MurielVolume:
12
Année:
1995
Langue:
english
Journal:
josaa/12/8/josaa-12-8-1797.pdf
DOI:
10.1364/JOSAA.12.001797
Fichier:
PDF, 376 KB
english, 1995