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Novel Attenuated Total Reflection Fourier Transform Infrared Microscopy Using a Gem Quality Diamond as an Internal Reflection Element
Ekgasit, Sanong, Thongnopkun, PimthongVolume:
59
Année:
2005
Langue:
english
Pages:
6
Journal:
as/59/10/as-59-10-1236.pdf
DOI:
10.1366/000370205774430972
Fichier:
PDF, 166 KB
english, 2005