Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis
Chyou, Jin-Jung, Chu, Chih-Sheng, Chien, Fan-Ching, Lin, Chun-Yu, Yeh, Tse-Liang, Hsu, Roy Chaoming, Chen, Shean-JenVolume:
45
Année:
2006
Langue:
english
Journal:
ao/45/23/ao-45-23-6038.pdf
DOI:
10.1364/AO.45.006038
Fichier:
PDF, 113 KB
english, 2006