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Anisotropic Incoherent Reflection Model for Spectroscopic Ellipsometry of a Thick Semitransparent Anisotropic Substrate
Ossikovski, Razvigor, Kildemo, Morten, Stchakovsky, Michel, Mooney, MarcusVolume:
39
Année:
2000
Langue:
english
Journal:
ao/39/13/ao-39-13-2071.pdf
DOI:
10.1364/AO.39.002071
Fichier:
PDF, 114 KB
english, 2000